New and Emerging X Technologies

An End-to-End AFP Defect Inspection and Analysis Tool


Authors

Matthew Godbold, Christopher Sacco, Roudy Wehbe, Ramy Harik

Conference

SAMPE 2022 Conference & Exhibition, Charlotte, NC

Citation

Matthew Godbold, Christopher Sacco, Roudy Wehbe, & Ramy Harik. (May 2022). An End-to-End AFP Defect Inspection and Analysis Tool. SAMPE 2022 Conference & Exhibition, Charlotte, NC.